Passaglia E. et al (eds.) Ellipsometry in the Measurement of Surfaces and Thin Films

Washington, D.C.: National Bureau of Standards, 1964. - vi, 359 p.
Symposium Proceedings Washington 1963
Symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C.
Edited by E. Passaglia, R. R. Stromberg, and J. Kruger
National Bureau of Standards Miscellaneous Publication 256Measurements of the thickness of thin films by optical means, from Rayleigh and Drude to Langmuir, and the development of the present ellipsometer.
Optical study of a thin absorbing film on a metal surface.
Optical properties of inhomogeneous films.
Computational techniques for the use of the exact Drude equations in reflection problems.
Factors influencing the experimental sensitivity of the Drude technique
Increased scope of ellipsometric studies of surface film formation.
Electronic polarimeter techniques.
On determining optical constants of metals in the infrared.
Use of ellipsometry for in situ studies of the oxidation of metal surfaces immersed in aqueous solutions.
An assessment of the suitability of the Drude-Tronstad polarized light method for the study of film growth on polycrystalline metals.
Studies of thin oxide films on copper crystals with an ellipsometer.
Optical study of the formation and stability of anodic films on aluminum.
Ellipsometry in electrochemical studies.
Application of ellipsometry to the study of phenomena on surfaces
prepared in ultra-high vacuum.
Measurement of the physical adsorption of vapors and the chemisorption of oxygen and silicon by the method of ellipsometry.
Application of ellipsometry to the study of adsorption from solution.
Determination of thickness and refractive index of thin films as an approach to the study of biological macromolecules.
Blood coagulation studies with the recording ellipsometer.
Ellipsometry for frustrated total reflection.
Passaglia E. et al (eds.) Ellipsometry in the Measurement of Surfaces and Thin Films